Microwave Holographic Metrology of the Surface Accuracy of Reflector Antenna-Simulation Method
The basic principle of microwave holographic metrology is simply described.The mathematic relationships between the phase error of aperture field and the optical path-length difference of antenna reflector, between normal error and surface accuracy were deduced.Take the gravity deformation of a large reflector antenna for deep space observation for example, the simulation method in the far-field used for microwave holographic metrology of surface accuracy of reflector antenna was presented.The holographic results of the pattern simulation with lowresolution medium accuracy and high-resolution high accuracy were simulated respectively.The simulation results show that reflector accuracy was increased from 1.77 to 0.241 mm and the antenna gain was increased by 1.75 dB at X band in the period of low-resolution medium accuracy;The gain at Ka band was increased by 0.95 dB and the side-lobe level was decreased by 0.8 dB in the period of lowresolution using high-frequency high-resolution simulation.
Surface accuracy Holographic metrology Resolution Radiation pattern Fourier transform
Yuhu Duan
The North West China Research Institute of Electronic Equipment, Xian 710065, China
国际会议
The 27th Conference of Spacecraft TT&C Technology in China(第27届中国飞行器测控学术会议)
广州
英文
103-111
2014-11-09（万方平台首次上网日期，不代表论文的发表时间）