Influence of Cu Orientation on the Growth of Cu-Sn Intermetallics and Interfacial Reaction of Cu/Sn Diffusion Couple
The copper substrates with different preferred orientations(200)and(220)were prepared and the interfacial reactions of the Cu(200)/Sn and Cu(220)/Sn diffusion couples were studied after annealing at 423K.The thickness and morphology of the intermetallic compounds were investigated.The appearance of the Cu3Sn was observed at Cu(220)/Sn interface after aged for 4 hours and then the thickness of Cu3Sn grown quickly.There is less Cu3Sn at Cu(200)/Sn interface but the Cu6Sn5 grown quickly and quantities of voids gathered into cracks.The preferred orientations of the Cu substrates are believed to be the reasons of the different interfacial reactions phenomena.
orientation interfacial reactions electroplate
Shan Yang Li Peng Yishi Tao Anmin Hu Ming Li
State Key Laboratory of Metal Matrix Composites,School of Material Science and Engineering,Shanghai Shanghai Entry-Exit Inspection and Quarantine Bureau,China
国际会议
The 15th International Conference on Electronic Packaging Technology (ICEPT 2014) ) (第十五届电子封装技术国际会议)
成都
英文
121-124
2014-08-12(万方平台首次上网日期,不代表论文的发表时间)