会议专题

Investigation of Lumen Degradation Mechanisms of Mid-power LED by HAST

  In this paper,the degradation modes and degradation mechanisms of mid-power LEDs were presented.For this study,commercially available mid-power LED packages were aged by method of accelerated temperature and humidity stress test(HAST).During ageing test,the ambient temperature and relative humidity was hold at 105℃ and 100%RH separately,which is so-called “105℃/100%RH.As a result,little lumen decay was found in LED packages aged that is not stressed by current,while sharp lumen decay was observed in LED packages stressed by constant current.Physics analysis indicated that sharp lumen decay of the LED packages was mainly due to carbonization of the silicone plate,which was resulted from either the self-heating of phosphors or over-absorption of blue lights.The degradation trend observed in “105℃/100%RH was different from that in “85C/90%RH,indicating that different degradation mechanisms were triggered in HAST other than that in the steady-state humidity life test.Though a few researchers had demonstrated HAST was a potential method for fast lifetime assessment of white light LED packages,experiments should be carefully designed to prevent improper lifetime prediction.

white light LED lumen degradation lumen decay accelerated HAST humidity moisture

Jianlin Huang Sau Koh Xiupeng Li Guoqi Zhang

Beijing Research Center,Delft University of Technology,Beijing,China Philips Lighting,Shanghai,China Delft Institute of Microsystems and Nanoelectronics(Dimes),Delft University of Technology,Netherland

国际会议

The 15th International Conference on Electronic Packaging Technology (ICEPT 2014) ) (第十五届电子封装技术国际会议)

成都

英文

1437-1441

2014-08-12(万方平台首次上网日期,不代表论文的发表时间)