Dielectric Loss at Millimeter Range and Temperatures 300-950 K, and Electrophysical Properties in Diamonds Grown by the Arc Plasma Jet Technology
The results of study of the dielectric loss at millimeter (MM) wavelengths range and temperatures 300950K in two different diamonds grown by the arc plasma jet (APJ) technology are presented. The electrophysical properties and parameters of point defects are also investigated. A comparison of results was made for these samples with the diamonds which have been grown by the technology of microwave plasma chemical vapor deposition (MPCVD). It is revealed that both frequency and temperature loss dependences as well as the electrophysical properties and parameters of point defects in the APJ diamonds essentially differ from the MPCVD diamonds properties. Also these properties in the studied APJ diamonds also essentially differ. The dielectric loss mechanisms are discussed.
B.M.Garin V.I.Polyakov A.I.Rukovishnikov A.V.Khomich V.V.Parshin E.A.Serov Ch.Ch.Jia F.X.Lu W.Z.Tang
Kotelnikov Institute of Radio Engineering and Electronics of Russian Academy of Sciences Fryazino Br Institute of Applied Physics of Russian Academy of Sciences 46, Ulianov Str., Nizhny Novgorod 603950 Beijing University of Science and Technology, 30, Cellege Str., Beijing 100083, China
国际会议
Progress in Electromagnetics Research Symposium 2014(2014年电磁学研究新进展学术研讨会)
广州
英文
2096-2099
2014-08-01（万方平台首次上网日期，不代表论文的发表时间）