Research of Temporal Speckle Pattern Interferometry for in-plane Measurement

摘要：

　　In this paper,a ridge algorithm which is based on wavelet analysis is adopted in the measurement of in-plane displacement.To measure in-plane displacement by electronic speckle pattern interferometry(ESPI),a series of speckle patterns are captured with the help of a CCD camera which is known as temporal speckle pattern interferometry(TSPI)technique and TSPI technique has better correlation and a larger measuring range compared with ESPI technique.To retrieve the phase fluctuation caused by the displacement of specimen,three types of complex wavelets are selected in the wavelet analysis to compare with the traditional Fourier analysis.

关键词： Speckle Interferometry Wavelets Fourier transform Phase retrieval

作者: Guangyu Li Zhan Gao Yan Deng

作者单位: Key Laboratory of Luminescence and Optical Information of Ministry of Education,Beijing Jiaotong University,Beijing,100044,China

会议类型: 国际会议

会议名称: 2013 International Conference on Optical Instrument and Technology (OIT’2013)(2013年光学仪器与技术国际会议)

会议地点: 北京

会议语种:英文

页码: 1-10

在线出版日期: 2013-11-17（万方平台首次上网日期，不代表论文的发表时间）