Refractive Index Profiling of Metal-diffused Planar Waveguides Using a Differential Near-field Optical Microscopy

摘要：

　　A differential near-field scanning optical microscopy(DNSOM)was used to reconstruct the refractive index profile of a Ti:LiNbO3 planar waveguide.The waveguide was measured at 633nm for single-mode operation.The reconstructed index profile matches well with known index model of Ti:LiNbO3 waveguides.Guiding mode profile calculated from fitted index model also shows good agreement with measured mode profile.

作者: W.-S.Tsai P.K.Wei

作者单位: Department of Applied Materials and Optoelectronics Engineering National Chi-Nan University,Taiwan Research Center for Applied Sciences,Academia Sinica,Taiwan;Department of Optoelectronics,National T

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2013(2013年电磁学研究新进展学术研讨会)

会议地点: 台北

会议语种:英文

页码: 183-186

在线出版日期: 2013-03-01（万方平台首次上网日期，不代表论文的发表时间）