A Surface-potential Based Compact Model of Gate Capacitance in GaN HEMTs
A new surface-potential based compact model of the gate capacitance C99 in GaN HEMTs is presented.The 2-D Poisson equation in the GaN layer included the spontaneous and piezoelectric charge terms is solved to obtain an accurate and continuous physics-based analytic explicit calculation of the surface potential.The proposed surface potential provides the accurate descriptions of accumulation and transitional region,develops consistent and higher order differential current and charge equations.The resulted C99 expressions are given explicitly in close form,which will highly improve the simulation continuity and accuracy.
Jie Wang Lingling Sun Jun Liu Mingzhu Zhou
Key Laboratory of RF Circuits and Systems,Ministry of Education,Hangzhou Dianzi University,China;Dep Key Laboratory of RF Circuits and Systems,Ministry of Education,Hangzhou Dianzi University,China
国际会议
Progress in Electromagnetics Research Symposium 2013(2013年电磁学研究新进展学术研讨会)
台北
英文
1195-1198
2013-03-01(万方平台首次上网日期,不代表论文的发表时间)