Scanning Near-field Millimeter Wave Microscope Combining Dielectric Tapered Probes and Metal Tips

摘要：

　　In this paper,we built a free-space scattering-type scanning near-field millimeter wave microscope using two tapered dielectric probes facing each other and a sample in between based on MVNA.Nylon,Teflon and PVC dielectric tapered probes are compared in this system.We adopted a PVC probe and a Teflon probe as incident and receiving probes.The resolution is frequency dependent.In order to increase the resolution and contrast,we additionally positioned a metal probe tip between the dielectric tapered probe and the object under test.First experiment results on this signal improvement concept will be reported for a 2 μm tungsten probe,yielding an increased field enhancement and leading to the contrast improvement.

作者: B.Zhu S.Vanloocke V.Matvejev J.Stiens D.De Zutter R.Vounckx

作者单位: Laboratory for Micro-and Photon Electronics,Department of Electronics and Informatics Vrije Universi Department of Information Technology(INTEC),UGent,Sint-Pietersnieuwstraat 41,Gent 9000,Belgium

会议类型: 国际会议

会议名称: Progress in Electromagnetics Research Symposium 2011(2011年电磁学研究新进展学术研讨会)

会议地点: 苏州

会议语种:英文

页码: 1487-1490

在线出版日期: 2011-09-01（万方平台首次上网日期，不代表论文的发表时间）