Image Stitching Based on Local Symmetry Features
new algorithm is presented for image stitching based on local symmetry features.Firstly,feature points are extracted using the detector based on local symmetry.Secondly,SIFT descriptor and local symmetry descriptor are combined to characterize those feature points.Thirdly,feature matching is carried out by randomized KD-trees and transform parameters are calculated by the correct inner points after the RANSAC was used to eliminate wrong matches.Finally,image stitching is completed with smoothing algorithm.The experimental results indicate that the proposed method has a higher matching precision than SIFT and SURF under the non-linear illumination change scenarios and can achieve better performance in image stitching.
image stitching image registration feature matching local symmetry features
YANG Di BO Yu-ming ZHAO Gao-peng
College of Automation,Nanjing University of Science and Technology,Nanjing 210094
国际会议
The 33th Chinese Control Conference第33届中国控制会议
南京
英文
4641-4646
2014-07-28(万方平台首次上网日期,不代表论文的发表时间)