Deformation and failure of damage-free submicron-sized metallic glass wires under uniaxial tension

摘要：

　　Field ion microscopy was applied for uniaxial tension tests at cryogenic temperature.The plastic deformation of near damage-free submicron-sized metallic glass wires was found to remain shear band operation even the diameter was less than 200 nm.The critical sample dimension for inhomogeneous-to-homogeneous transition may be overestimated before.

关键词： Metallic glass Field ion microscopy Tension

作者: ZHAO Kai

作者单位: School of Metallurgical and Materials Engineering,Chongqing University of Science and Technology,Chongqing,401331,China;WPI-Advanced Institute for Materials Research,Tohoku University,2-1-1 Katahira,Sendai 980-8577,Japan

会议类型: 国际会议

会议名称: The 7th International Conference on Electromagnetic Processing of Materials(第七届冶金与材料电磁过程国际大会)

会议地点: 北京

会议语种:英文

页码: 1-4

在线出版日期: 2012-10-22（万方平台首次上网日期，不代表论文的发表时间）