Vibration Test and Analysis of a High-Tech Electronics Plant in Suzhou

摘要：

　　Increasing high-tech electronics plants with vibration-sensitive equipments are under construction in recent years, and the requirement for micro-vibration control is becoming more and more stringem than before.In this paper, the micro-vibration field measurement results of a high tech electronics plant in Suzhou are presented.Internationally accepted one-third octave band meth od is adopted to analyze the acquired acceleration waveform in the time domain and the vibrational characteristics of the ground are analyzed.Finally, reasonable suggestions for micro-vibration con trol are proposed for the design of similar electronics plants.

关键词： micro-vibration control one-third octave band method vibration acceleration

作者: Z.Jiang G.Y.Gao J.Song L.Zeng S.J.Feng

作者单位: Department of Geotechnical Engineering, Tongji University, Shanghai, China Key laboratory of Geotechnical and Underground Engineering of Ministry of Education, Tongji University, Shanghai, China

会议类型: 国际会议

会议名称: 第六届国际环境振动学术研讨会(6th International Symposium on Environmental Vibration)(ISEV2013)

会议地点: 上海

会议语种:英文

页码: 254-259

在线出版日期: 2013-11-08（万方平台首次上网日期，不代表论文的发表时间）