Research on Metrology for Microwave Landing System Simulator

摘要：

　　The author presents the series of research achievement on metrology for microwave landing system (MLS) simulator, including demonstration for parameter system of metrology, methology for metrology support and development of autonartic metrology system.The application shows that the findings have surmounted technical diifficulties of MLS simulator metrology support and ensured the parameters accuracy and consistency of MLS, which make sense for inproving flight safety.

关键词： microwave landing system (MLS) simulator metrology measurement standard calibration

作者: Li Qiongwei Yu Suya Xue Fei Ma Wenjing

作者单位: Aero-instrument Test and Calibration Center 181＃,Baipengyao,Fengtai,Beijing,China

会议类型: 国际会议

会议名称: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments(第十一届IEEE国际电子测量与仪器学术会议)

会议地点: 哈尔滨

会议语种:英文

页码: 32-36

在线出版日期: 2013-08-16（万方平台首次上网日期，不代表论文的发表时间）