Research on the Calibration Technique of On-wafer Load-pull System

摘要：

　　By using load-pull technique, non-linear device behavior can be obtained through changing the source impedance or load impedance.Load-pull system is so complex that there is no effective way for its performance metrology, which results in significant variance of device parameter, such as power, gain, and PAE.This paper discusses in-situ calibration of on-wafer load-pull system and provides the verified result.The technique mentioned in this paper can calibrate the performance of the on-wafer load-pull system reliably and roundly, and give the measurement uncertainty of the system.Thus the calibration scheme is more reasonable, while the measurement result is more reliable.

关键词： on-wafer load-pull transfer standards calibration

作者: Luan Peng Liang Faguo Han Zhiguo Li Jingqiang Qiao Yue

作者单位: Hebei Semiconductor Research Institute,Shijiazhuang,050051,China

会议类型: 国际会议

会议名称: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments(第十一届IEEE国际电子测量与仪器学术会议)

会议地点: 哈尔滨

会议语种:英文

页码: 454-458

在线出版日期: 2013-08-16（万方平台首次上网日期，不代表论文的发表时间）