Research Progress of Metrology of Digital Modulation Error Parameters
Digital modulation error parameters, such as error vector magnitude EVM, is important in test and measurement of information system.This paper introduces the technology research progress in the metrology of digital modulation error parameters.First, we point out the basic problems existing in the field, which is about traceability and parameter range of calibration, and describe the relevant research, such as the thinking and technology of the RF waveform metrology.Then, we highlight the research progress of our team: 1).The metrology method and system for digital demodulation error parameter based on CW combination, which fits BPSK, QPSK, 8PSK, 16QAM, 64QAM modulation: this method can achieve traceability and error setting ability in a wide range, when standard EvmRms is 1.585%, the expanded uncertainty (k=2) is 0.009%.2).The metrology method and system for digital demodulation error parameter based on analog AM or PM 3).The metrology method and system for digital demodulation error parameter based on IQ gain imbalance andphase imbalance.4).The metrology method and system for digital demodulation error parameter based on analog PM in the aspect of GMSK and FSK modulation.5).The metrology method and system for digital demodulation error parameter based on Baseband waveform design.Based on these methods, our proposal are given as follows: first, establish public metrology standard for digital modulation error parameters; second develop a new type of instrument vector signal analyzer calibrator.
digital modulation error calibration traceability EVM VSA
Zhou Feng Zhang Rui Anlei Rao Sun Jinglu Shi Dan Shen Yuanmao Gao Yougang
Beijing University of Posts and Telecommunications,Beijing 100876,China;Telecommunication Metrology Telecommunication Metrology Center of MIIT,Beijing 100191,China Beijing University of Posts and Telecommunications,Beijing 100876,China
国际会议
哈尔滨
英文
515-520
2013-08-16（万方平台首次上网日期，不代表论文的发表时间）