Observation on Non-conductive Powder Samples by Scanning Electron Microscope

摘要：

　　Different fixation methods have significant influence on observation of samples by scanning electron microscopy when non conductive samples are processed by plasma spudtter coating method.Non conductive powder samples using different treatments are observed on Philips XL30 scanning electron microscope and Hitachi S-4800 field emission scanning electron microscope.For the small size samples processed by two fixation methods, Sample shape were observed more clearly by the ultrasonic dispersion preparation on scanning electron microscope and had less interference of ion sputtering thermal effect.The effect is not obvious for the large size samples, and the effect of observation for non conducting samples is better on field emission scanning electron microscope at low accelerating voltage.

关键词： scanning electron microscope sample preparation direct dispersion method ultrasonic dispersion method

作者: Yuanhui Ma Xinghua Zhang Xueguang Chen

作者单位: School of Materials Science and Engineering,Hebei University of Technology,Tianjin 300130,China

会议类型: 国际会议

会议名称: 2012 China Functional Materials Technology and Industry Forum(2012中国功能材料科技与产业高层论坛)(CFMTIF2012)

会议地点: 昆明

会议语种:英文

页码: 226-229

在线出版日期: 2012-11-09（万方平台首次上网日期，不代表论文的发表时间）