Synchrotron-radiation X-ray Topography of the Rapid Grown KDP Crystals

摘要：

　　KDP crystals were rapidly grown from point seeds by temperature reduction method.White-beam synchrotron radiation X-ray topography was used to study the growth imperfections in KDP crystals.Strong dislocation bunches originate on the prismatic faces of the seed were found.The producing reason of these dislocation bunches was discussed.Sector boundary between the prismatic sector and pyramid sector caused by the unbalance distribution of trivalent metal ions were also observed and analyzed.

关键词： KDP crystal defects White-beam synchrotron radiation X-ray topography

作者: Bing Teng De-gao Zhong Li-feng Cao Shu-hua Wang Xue-jun Jiang Jiang-tao Ma Shi-ming Zhang Bing-tao Zhang Wan-Xia Huang

作者单位: Physics Science College of Qingdao University,Qingdao,266071,P.R.China;Key Laboratory of Photonics M Physics Science College of Qingdao University,Qingdao,266071,P.R.China Beijing Synchrotron Radiation Laboratory,Institute of High Energy,Beijing,100039,P.R.China

会议类型: 国际会议

会议名称: 2012 China Functional Materials Technology and Industry Forum(2012中国功能材料科技与产业高层论坛)(CFMTIF2012)

会议地点: 昆明

会议语种:英文

页码: 325-328

在线出版日期: 2012-11-09（万方平台首次上网日期，不代表论文的发表时间）