Fabric Defect Detection Based on Cross-entropy

摘要：

　　The core of fabric defects detection is the collection and processing of fabrics image.A scheme for fabric defect detection based on cross-entropy is proposed in this paper.The cross-entropy value illuminates the information difference between the template image and the real-time image on the average.So can take advantage of cross-entropy criteria to use for defect detection and identification.Results have confirmed the usefulness of this scheme for fabric defect detection.

关键词： cross-entropy fabric defects image inspect

作者: Bao-Ming HAO Hai-Feng Xu Huan-Yin Guo

作者单位: School of Mechanical and Electronic Engineering,Suzhou University,Suzhou,Anhui 234000,P.R.China

会议类型: 国际会议

会议名称: 2013 2nd international Conference on Opto-Electronics Engineering and Materials Eesearch(2013第二届光电工程与材料研究国际会议)(OEMR2013)

会议地点: 郑州

会议语种:英文

页码: 1992-1995

在线出版日期: 2013-10-19（万方平台首次上网日期，不代表论文的发表时间）