The Application of Non-destructive Testing Based on Terahertz Technology in the Field of Smart Grid

摘要：

　　The terahertz technology involves electromagnetics,semiconductor physics,optoelectronics,materials science and micro-processing technology and other disciplines.Based on terahertz technology,non-destructive testing has important research value and application prospect in the field of medical imaging,security checking,product testing and power system monitoring.The generation of terahertz technology and its advantages is described in this article,and an analysis is also given on the application of non-destructive testing based on terahertz technology in the field of smart grid such as cable accident warning,intelligent anti-theft system and electronic components monitoring.

关键词： Smart Grid Non-destructive Testing Terahertz Technology

作者: Xiaojuan Li Ming Wang Xiaobin Liang Xianlong Zhao Mingfei Zhao

作者单位: Communication & Power Utilization Subcomany of Nari Group Corporation,Haidian,Beijing,102200,China

会议类型: 国际会议

会议名称: 2013 2nd international Conference on Opto-Electronics Engineering and Materials Eesearch(2013第二届光电工程与材料研究国际会议)(OEMR2013)

会议地点: 郑州

会议语种:英文

页码: 2068-2071

在线出版日期: 2013-10-19（万方平台首次上网日期，不代表论文的发表时间）