Analysis on Thickness Dependence of Jc Caused by Dislocations and Grain Boundaries in YBCO Superconducting Films

摘要：

　　A parallel connection model for thickness dependence of Jc caused by dislocations and grain boundaries in YBCO superconducting films is established.Several expressions are deduced to describe the distribution of dislocation and grain boundary.Two extreme conditions are discussed,which involves the drastic drop in Jc caused totally by grain boundary and the drop in Jc not caused by grain boundary.Combining the experiment and analysis results,it is obtained the quantitative relation with thickness dependence of Jc and dislocations and grain boundaries.

作者: Z.LEI J.DING P.WENG X.CAI

作者单位: Shanghai Institute of Applied Mathematics and Mechanics, Shanghai University, Shanghai 200072,China

会议类型: 国际会议

会议名称: Sixth International Conference on Nonlinear Mechanics(第六届国际非线性力学会议)(ICNM-VI)

会议地点: 上海

会议语种:英文

页码: 158-160

在线出版日期: 2013-08-01（万方平台首次上网日期，不代表论文的发表时间）