A microstructure-based model for simulation of short fatigue crack growth in 3 Dimensions

摘要：

　　A microstructure-based model was developed to quantify short fatigue crack growth in 3 dimensions in high strength Al alloys.Based on the previously proposed crystallographic model for short crack growth across a gran boundary,the resistance of the grain boundary to crack growth was defined as a Weibull-type function of the twist angle of the crack plane deflection at the boundary.

关键词： short fatigue crack 3-D growth microstructure-based model resistance to crack growth Al alloys

作者: Tongguang Zhai Wei Wen Yuanbin Zhang Bin Xu

作者单位: Department of Chemical and Materials Engineering,University of Kentucky,Lexington 40506,USA Department of Materials Science and Engineering,Shandong Jianzhu University,Jinan 250101,China

会议类型: 国际会议

会议名称: 第13届国际断裂大会(ICF2013)

会议地点: 北京

会议语种:英文

页码: 1-1

在线出版日期: 2013-06-16（万方平台首次上网日期，不代表论文的发表时间）