Influence of the misfit strain and temperature on the characteristics of the metal-ferroelectric-insulator-semiconductor field-effect transistors

关键词： MFIS-FETs temperature strain memory window

作者: Xiangli Zhong Limei Jiang Yi Zhang Jinbin Wang Yichun Zhou

作者单位: Faculty of Materials,Optoelectronics and Physics,Xiangtan University,Xiangtan 411105,China;Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education,Xiangtan University,Xiangtan 411105,China

会议类型: 国际会议

会议名称: 第13届国际断裂大会(ICF2013)

会议地点: 北京

会议语种:英文

页码: 1-1

在线出版日期: 2013-06-16（万方平台首次上网日期，不代表论文的发表时间）