A Novel Dual-Galvanometers Control Card
Large format and multi-Galvanometers laser marking has been more difficult to deal with the problems in the field of laser marking.So the novel dual-galvanometers control card is proposed by the paper.The card received data from the computer marking graphics software by USB interface,and then decomposed coordinates in the FPGA.So it can ease realized format stitching by synchronous controlled dual-galvanometers.It also has no F-θ mirror deformation at the stitching due to adjustment the parameters of relative position between the two planes of motion.From the simulation results and experimental results,the card was proved to effectively meet the large-format laser marking applications.
Large Format Dual-Galvanometers Control Deformation of F-θmirror
Wang Zhen
Wuhan Institute of Technology,693 Xiongchu Avenue,Wuhan,Hubei,China
国际会议
武汉
英文
299-302
2013-06-15（万方平台首次上网日期，不代表论文的发表时间）