Subwavelength Defect Characterization Using Guided Wave Scattering Matrix

摘要：

　　Although many imaging algorithms such as ellipse and hyperbola algorithm can roughly locate defects in large plate-like structures with sparse guided wave arrays,quantitative characterization of them is still a challenging problem,especially for those small defects known as subwavelength defects.Scattering signals of defects contain abundant information so that can be used to evaluate defects.A defects recognition method using the S-matrix (scattering matrix) was presented.S-matrices of hole and crack with S0 mode incident were experimentally measured.The results show that defects can be recognized from the morphology of 2D S-matrix chart.This method has great potential to achieve more specific parameters of small defects with sparse guided wave arrays.

关键词： scattering matrix guided wave sparse arrays defect recognition quantitative measurement

作者: Yang Zheng Jinjie Zhou Hui Zheng

作者单位: China Special Equipment Inspection and Research Institute, Beijing, China College of Mechanical Engineering and Automatization,North University of China, Taiyuan, China

会议类型: 国际会议

会议名称: 2nd International Conference on Materials Engineering and Automatic Control (第二届材料工程与自动化控制国际会议)(ICMEAC2013)

会议地点: 济南

会议语种:英文

页码: 504-509

在线出版日期: 2013-05-18（万方平台首次上网日期，不代表论文的发表时间）