Compatibility check of the prior information on low voltage switchgear

摘要：

　　Generally,the test data of the low voltage switchgear are very few.In order to assess the reliability more accurately,historical data are used to maximum the capacity of the test data.The premise of using the prior information is the prior data and test data should approximately come from the same overall.This is just the problem of compatibility check.In this paper,the method of fitting data and the law of testing the distribution are used to analyze both the priori and test data.Furthermore,we present a novel method of using Wilcoxon rank sum test to check the compatibility of the prior and test data of the low voltage switchgear.Both methods lead to the conclusion that the prior and the test data of the low voltage switchgear are compatible.

关键词： prior information fitting Wilcoxon rank test compatibility check

作者: LIU BING-YUE WANG JING-QIN

作者单位: School of electrical engineering, Hebei University of technology, Tianjin, China

会议类型: 国际会议

会议名称: 2nd International Conference on Materials Engineering and Automatic Control (第二届材料工程与自动化控制国际会议)(ICMEAC2013)

会议地点: 济南

会议语种:英文

页码: 830-833

在线出版日期: 2013-05-18（万方平台首次上网日期，不代表论文的发表时间）