The Typical Case Study of the Electronic Product Reliability Enhancement Testing

摘要：

　　Based on the most advanced reliability engineering concept,the paper explored a cost-effective RET testing method aiming to solve the defects found in early design,manufacturing process and components.Three cases were presented in this paper that demonstrated the complete process of how to stimulate and eliminate defects.The solid firsthand case analysis has yield valuable experiences that could benefit electronic products reliability enhancement testing.

关键词： Reliability Enhancement Testing (RET) Design defect Process defect Electronic component defect

作者: Haixin Peng Rui Kang

作者单位: School of Reliability and Systems Engineering, Beihang University, Beijing, China

会议类型: 国际会议

会议名称: 3rd International Conference on Frontiers of Manufacturing and Design Science(第三届制造与设计科学前沿国际会议(ICFMD))

会议地点: 香港

会议语种:英文

页码: 684-689

在线出版日期: 2012-12-11（万方平台首次上网日期，不代表论文的发表时间）