Fast Life-Time Assessment of LED Luminaries:Step Stress Accelerated Test Approach
The life-time assessment is becoming a big concern for the emerging illumination applications.It is requested urgently to develop an effective and fast life-time qualification method to support and drive LED industry.In this paper,firstly an overview of the life-time assessment methods for LED products is conducted.A comparison has been made among the methods.Traditional constant stress accelerated test (CSAT) requires long test duration,with complication to select stress level,large sample size,high test cost and so on.The step stress accelerated test (SSA T) method has several advantages,such as suit-able for long life field,short test time and few sample size,showing the potential for application to the reliability testing for LED products.Secondly,SSA T study was conducted on LED products.A design of experiments was performed based on our preliminary SSAT results.Then a series of tests have been carried out.The effective accelerated degradation paths demonstrated that a fast life-time qualification procedure can be developed with step stress testing.Based on the test results,a step stress based fast life-time assessment approach is proposed for LED Products.
Reliability testing Step stress accelerated test (SSAT) LED products Qualification Long life
Daoguo Yang Miao Cai Wenbin Chen Zhen Zhang G.Q.Zhang
Guilin University of Electronic Technology, China Delft University of Technology, the Netherlands
国际会议
9th China International Forum on Solid State Lighting(第九届中国国际半导体照明论坛)
广州
英文
72-75
2012-11-05（万方平台首次上网日期，不代表论文的发表时间）