会议专题

Research on Integrated Diagnosis of Contact and Non-contact Method for Analog Circuit

  Traditional analog diagnoses by contact way generally get voltage, current or frequency response as their inputs.They have some inevitable drawbacks, such as the change of inputs during contacting and the inaccessibility of some necessary notes.Furthermore, contact method rarely does well in multi-faults.It can get high fault resolution or fault coverage only by high complexity of algorithm.This paper proposes a method of Integrated Diagnosis to solve the problems above.This method acquires raw data from both contact and non-contact way.It gets feature extraction and draws conclusions from the two ways respectively, and then fuses the two conclusions into a final decision.This method makes good use of information from multi-sensors.It obtains the advantages of both contact and non-contact way, but avoids the disadvantages of the two.Experiment shows its fault coverage and fault resolution both get an improvement, compared with that of other single methods.At the same time, it diagnoses multi-faults as simple and efficient as single-faults.

Analog Circuit Integrated Diagnosis Non-contact Method Data Fusion

Hao Yanhong Wang Jiali

School of Electromechanical Engineering,Xidian University,Xian,710071,China

国际会议

the 2012 International Conference on Vibration, Structural Engineering and Measurement (2012年振动、结构工程与测量国际会议(ICVSEM2012))

上海

英文

1899-1905

2012-10-19(万方平台首次上网日期,不代表论文的发表时间)