Research on Integrated Diagnosis of Contact and Non-contact Method for Analog Circuit
Traditional analog diagnoses by contact way generally get voltage, current or frequency response as their inputs.They have some inevitable drawbacks, such as the change of inputs during contacting and the inaccessibility of some necessary notes.Furthermore, contact method rarely does well in multi-faults.It can get high fault resolution or fault coverage only by high complexity of algorithm.This paper proposes a method of Integrated Diagnosis to solve the problems above.This method acquires raw data from both contact and non-contact way.It gets feature extraction and draws conclusions from the two ways respectively, and then fuses the two conclusions into a final decision.This method makes good use of information from multi-sensors.It obtains the advantages of both contact and non-contact way, but avoids the disadvantages of the two.Experiment shows its fault coverage and fault resolution both get an improvement, compared with that of other single methods.At the same time, it diagnoses multi-faults as simple and efficient as single-faults.
Analog Circuit Integrated Diagnosis Non-contact Method Data Fusion
Hao Yanhong Wang Jiali
School of Electromechanical Engineering,Xidian University,Xian,710071,China
国际会议
上海
英文
1899-1905
2012-10-19（万方平台首次上网日期，不代表论文的发表时间）