Effect of Ar Pressure on Properties of Polycrystalline CdZnTe Films

摘要：

　　Polycrystalline CdZnTe (CZT) films were grown by close-spaced sublimation method.The CdZnTe films were prepared on fluorine doped tin oxide (FTO) glass substrates at various argon (At) pressures from 200 Pa to 700 Pa.A comparative study of the films at different pressures was obtained by X-ray diffraction (XRD),scanning electron microscope (SEM) and Energy dispersive spectrometer (EDS) respectively.The XRD studies revealed that CdZnTe films had a preferential orientation along the (111) phase except the one at 500 pa.EDS analysis indicated that the increasing of Ar pressure decreased Zn content.

关键词： CdZnTe film Ar pressure close-spaced sublimation

作者: Beiling Yao Linjun Wang Jian Huang Liangmin Cai Ke Tang Bing Ren Jie Zhou Jun Le Liya Shen Yue Zhu

作者单位: School of Materials Science and Engineering,Shanghai University,No.149 Yanchang Road,Shanghai 200072,China

会议类型: 国际会议

会议名称: 3rd International Conference on Testing and Evalution of Inorganic Materials(第三届无机材料测试与评价学术年会(TEIM2012))

会议地点: 景德镇

会议语种:英文

页码: 226-229

在线出版日期: 2012-10-15（万方平台首次上网日期，不代表论文的发表时间）