Effect of Oxygen Partial Pressure on Properties of ZnO Films Deposited on Freestanding Diamond Films
Highly c-axis-oriented zinc oxide (ZnO) films were deposited successfully on the nucleation sides of freestanding diamond (FSD) films by the direct current (DC) magnetron sputtering method in an oxygen (O2) + argon (Ar) gas mixture.The effect of oxygen partial pressure on properties of ZnO films was investigated by X-ray diffraction (XRD).The results showed that when flux ratio of argon to oxygen was 1,the ZnO films had a better crystalline quality.
zinc oxide magnetron sputtering diamond
Ke Tang Linjun Wang Jian Huang Bing Ren Jie Zhou Jun Le Yiben Xia
School of Materials Science and Engineering,Shanghai University,No.149 Yanchang Road,Shanghai,200072,China
国际会议
景德镇
英文
230-233
2012-10-15(万方平台首次上网日期,不代表论文的发表时间)