Study on Multi-path Low-light Stress Reliability Test System

摘要：

　　During the design approval and production approval tests on the low-light night version device,the light stress reliability test must be done.In this paper,the author analyzed the actual operational environment of the low-light night version device and designed a multi-path low-light reliability test system with adjustable illumination from two aspects including natural light spectrum and illumination in the night sky.Four-path combined integrating sphere low-light stress systems are adopted to simulate nighttime as the illumination quantificationally.During the test,the programs are designed according to the test so as to exert variable light stresses on the low light (namely product) automatically,monitor and control the light stress level automatically,identify and record the faults of the low-light night version device automatically,which soundly revolve the demands of the light stress reliability test of the low-light night version device.

关键词： Low-light level night vision device integrating sphere low-light level stress reliability test

作者: ZHANG Lei WANG Aiguo

作者单位: Changchun University of Science and Technology,Changchun 130022,Jilin,China

会议类型: 国际会议

会议名称: the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT-2012)(2012年电机工程与信息技术国际会议)

会议地点: 沈阳

会议语种:英文

页码: 1064-1069

在线出版日期: 2012-09-26（万方平台首次上网日期，不代表论文的发表时间）