会议专题

Loading Rate and Size Effect on the Fracture Behavior of BGA Structure Cu/Sn-3.0Ag-0.5Cu/Cu Interconnects

  The miniaturization of solder interconnects may lead to the excessive growth of brittle intermetallic compounds (IMCs) at the interface of solder joints,and this has brought serious reliability concern to flip chip (FC) and ball grid array (BGA) packages,in particular for the drop impact reliability of the solder joints in portable electronic products.In this study,the lap-shear behavior and critical factors affecting the drop impact performance of single BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu joints with different standoff heights (or volumes) were characterized.The experimental results show that the shear strength change of joints with standoff height exhibits a parabolic trend regardless of the shear loading rate,and the thermal aging can deteriorate the joints’ strength significantly.The failure position of the joints changes from the middle of the solder matrix to near the interface with increasing standoff height regardless of the shear loading rate and isothermal aging treatment.It seems that the drop resistance of small joints is only slightly influenced by the isothermal aging and loading rate.In addition,the probability of brittle fracture of the joints with 0.50 mm standoff height increases with increasing the loading rate and undergoing isothermal treatment.The geometry of the joints (standoff height) plays a dominant role in influencing the joints’ properties.While the interactive effect of the evolution of microstructure and standoff height results in the different brittle fracture modes of the joints after undergoing isothermal aging at 125℃.

Xun-Ping Li Hong-Bo Qin Yun-Fei En Jian-Min Xia Xin-Ping Zhang

School of Materials Science and Engineering,South China University of Technology,Guangzhou 510640,Ch School of Materials Science and Engineering,South China University of Technology,Guangzhou 510640,Ch Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,the

国际会议

2012 International Conference on Electronic Packaging Technology & Hiigh Pachaging(2012电子封装和高密度封装国际会议(ICEPT-HDP2012))

桂林

英文

1298-1302

2012-08-13(万方平台首次上网日期,不代表论文的发表时间)