Quality Monitoring and Prognostic of Electronics Using Multidimensional Time Series Method

摘要：

　　This paper presents a quality monitoring and prognostic method to evaluating quality of electronics through monitoring degradation path.Electronics multiple performance parameter degradation data are treated as multidimensional time series and described using multidimensional time series model to take into account implements of stochastic nature of environmental variables and to predict long-term trend of performance degradation.A degradation test is processed for certain electronics and three kinds of performance parameters degradation data are monitored for prognostics.A comparison between the predicted degradation path using multidimensional time series analysis, the predicted degradation path using one-dimensional time series analysis and the real degradation path of the electronics is processed and the results show that the degradation path prediction using the suggested method is more effective than one-dimensional time series analysis.

关键词： Quality Monitoring Prognostic Electronics Multidimensional Time Series

作者: Bo Wan Li Wang Guicui Fu

作者单位: School of Reliability and System Engineering,Beihang University,Beijing 100191,China School of Computer and Information Engineering,Beijing Technology and Business University,Beijing 10

会议类型: 国际会议

会议名称: the 3nd International Conference on Digital Manufacturing & Automation (第三届数字制造与自动化国际会议(ICDMA 2012))

会议地点: 桂林

会议语种:英文

页码: 1029-1032

在线出版日期: 2012-08-01（万方平台首次上网日期，不代表论文的发表时间）