Test Frequency Selection of Analog Circuit Based on Discrete Particle Swarm Algorithm

摘要：

　　A method of optimal test frequency selection for analog circuit fault diagnosis is proposed.The method simulates the circuit faulty states only in the bands with highest fault sensitivity and that reduces part of simulation cost.Test frequency selection is considered as a multi-objective optimization problem,discrete particle swarm algorithm is used as a new approach to get optimal test frequency sets.An example shows that the proposed method is effective in (ency) selection and works more efficiently compared with (o) algorithm.

关键词： Test frequency selection Discrete particle swarm algorithm Analog circuit Fitness function

作者: Zheng Zhigang Wu Liang

作者单位: Army Aviation Research Institute Beijing, China Control Engineer Department Naval Army Aviation University Yantai, China

会议类型: 国际会议

会议名称: 2012 2nd International Conference on Computer Application and System Modeling(2012第二届计算机应用与系统建模国际会议)(ICCASM-2012)

会议地点: 沈阳

会议语种:英文

页码: 615-618

在线出版日期: 2012-07-27（万方平台首次上网日期，不代表论文的发表时间）