Noise Analysis of EMCCD and Optimum Design of Its Operating Mode

摘要：

　　As the core device of Low-light-level imaging technology,EMCCD noise performance determines imaging results of camera system at the most extend.In this paper,noise models to EMCCD and relevant parameters of the noise sources are discussed,and the noise effect to the parameters is simulated.Based on the results of noise analysis,optimum operating areas for inverted mode and non-inverted mode are carried out,which are the theoretical foundation and references to low-light-level camera system design.

关键词： EMCCD Dark signal Clock Induced Charge Noise Analysis Low-light-level Imaging Electron Multiplication

作者: Yuigui Zhang Tao Li Zhikuan He

作者单位: Beijing Institute of Space Mechanics & Electricity,Beijing,China

会议类型: 国际会议

会议名称: 2012 International Meeting on Opto-Electronics Engineering and Materials Research(OEMR2012)(2012光电工程与材料国际会议)

会议地点: 沈阳

会议语种:英文

页码: 229-233

在线出版日期: 2012-07-27（万方平台首次上网日期，不代表论文的发表时间）