Resonance Suppression on Nanoscale Viscoelasticity Measurement
(0) During the broadband viscoelasticity measurement process,when the frequency of the excitation force become high relative to the resonant frequency or the bandwidth of the instrument dynamics,the adverse instrument dynamics is motivated,which causes the cantilever resonance and generates large measurement errors in the measurement data.To solve this problem,an approach to suppress the cantilever resonance on the broadband viscoelasticity measurement is proposed.Firstly,Atomic force microscope (AFM) system dynamic is analyzed by using a dynamic signal analyzer (DSA) in the z-axis.And a notch filter is designed as a prefilter of the AFM system to filter the input drive voltage in order to offset the resonance peak in the AFM model.Secondly,an adaptive filter based on LMS is designed to further eliminate the residual cantilever resonance effects on the complex compliance of soft materials,referring to the Hertz contact model.Finally,the proposed approach is illustrated by implementing it to remove the cantilever resonance effects on the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
atomic force microscope notch filter adaptive filter the least Mean square rule viscoelasticity measurement
Ping Xie Lei Zhang Qing-ze Zou
Institute of Electrical Engineering, Yanshan University, Qinhuangdao,Hebei, 066004, China Mechanical and Aerospace Engineering, Rutgers, the State University of New Jersey, Piscataway,NJ 088
国际会议
香港
英文
75-79
2012-07-26（万方平台首次上网日期，不代表论文的发表时间）