Effects of annealing temperature on optical properties of Bi3.4Nd0.6Ti3O12 films by RF magnetron sputtering method

摘要：

　　Bi3.4Nd0.6Ti3O12 (BNT) thin films have been prepared on Si (100) substrate by RF magnetron sputtering method.The crystalline structures were studied by X-ray diffraction.The surface of the films have been observed by SEM.The reflectivity was measured by n & k Analyzer 2000 with the wavelength from 190 to 900 nm.The optical constant,thickness and the forbidden band gap were fitted.The results showed that with the annealing temperatures raised from 600 to 750 ℃,the reflectivity index decreased from 2.224 to 2.039,and the forbidden band gap decreased from 3.19 to 2.99 eV.The possible mechanism of the effect of annealing temperature on the optical properties was discussed.

关键词： Bismuth titanate Thin films Annealing temperature Optical property

作者: Yan Zou Qiuxiang Liu Yanping Jiang Xingui Tang

作者单位: School of Physics and Optoelectric Engineering,Guangdong University of Technology,Guangzhou Higher Education Mega Center,Guangzhou,510006,China

会议类型: 国际会议

会议名称: the 2012 2nd International Conference on Frontiers of Manufacturing Science and Measuring Technology (第二届制造科学与检测技术国际会议(ICFMM 2012))

会议地点: 西安

会议语种:英文

页码: 620-624

在线出版日期: 2012-06-12（万方平台首次上网日期，不代表论文的发表时间）