Based on the deep hole processing system resonance test design of the device

摘要：

　　Deep hole processing system resonance test devices can accurately and quickly find the whole system resonance frequency,for use of negative pressure device system to processing components provided a convenient,makes the precision of parts is further improved.

关键词： the deep hole processing Resonance test Fast Processing precision

作者: Liu Yan Shu Liu Zhan Feng

作者单位: School of Mechanical Engineering,Xian Shi you University

会议类型: 国际会议

会议名称: the 2012 2nd International Conference on Frontiers of Manufacturing Science and Measuring Technology (第二届制造科学与检测技术国际会议(ICFMM 2012))

会议地点: 西安

会议语种:英文

页码: 1041-1044

在线出版日期: 2012-06-12（万方平台首次上网日期，不代表论文的发表时间）