会议专题

Theoretical Analysis for Sensitivity Enhancement in Broad-band Thermal Lens Microscope

  Thermal lens microscope (TLM) coupled to lab-on-chip chemistry in microfluidic systems is a powerful tool for analyzing a variety of compounds.However,the limited range of emission lines of laser-based TLM severely restricted the specificity of this technique and therefore limited the use of such TLM systems for practical applications.Here,a broad-band incoherent light source was introduced into the TLM to improve the specificity.A three-layer theoretical model was built.Through numerical simulation,it was found that at usual sample length of 100 μm in micro-volumes,the sensitivity can be increased by approximately one order of magnitude at low frequencies when the top and bottom layers are organic solvents.The sensitivity is even higher than that in laser excitation case.

Broad-band light source thermal lens microscope three-layer theory sensitivity enhancement

Mingqiang Liu Mladen Franko

Laboratory for Environmental Research,University of Nova Gorica,Vipavska 13,P.O.Box 301,SI-5000 Nova Gorica,Slovenia

国际会议

the 2012 2nd International Conference on Frontiers of Manufacturing Science and Measuring Technology (第二届制造科学与检测技术国际会议(ICFMM 2012))

西安

英文

1480-1483

2012-06-12(万方平台首次上网日期,不代表论文的发表时间)