会议专题

Microstructural characterization of epitaxial lateral overgrown (1(1)02) semi-polar GaN on (10(1)0) m-plane sapphire

Lin Zhou David J.Smith X.Ni (U).(O)zgür A.A.Baski H.Morko(c)

School of Materials &Department of Physics,Arizona State University,Tempe,Arizona 85287,USA Department of Electrical and Computer Engineering and Department of Physics,Virginia Commonwealth Un

国际会议

The 12th Beijing Conference and Exhibition on Instrumental Analysis (第十二届北京分析测试学术报告会(BCEIA 2007))

北京

英文

1-2

2007-10-18(万方平台首次上网日期,不代表论文的发表时间)