Accelerated Degradation Modeling and Statistical Analysis of MEMS device based on Competing Failure
Traditional reliability analysis of MEMS devices is based on only one failure mode,but paroxysmal failure and degradation failure are simultaneous on one MEMS device which is called as competing failure modes.Accelerated degradation modeling and parameter estimation based on competing failure modes are elementary contents of reliability analysis,in which paroxysmal failure and degradation failure are integrated in the process of educing reliability function,and elementary theories of reliability and statistics are used.The method of accelerated degradation modeling and parameter estimation is proved to be precise in a simulation of accelerated life test on a kind of MEMS device which have the two failure modes:paroxysmal failure and degradation failure,and they are have relations with stress variable:current.
Reliability Competing failure Modeling Parameter estimation
Qing Xia Zong Jie Cao Yuan Da Wang Peng Sun
Department of Aviation Mechanical Engineering, Aviation University of Air Force, Changchun,China
国际会议
广州
英文
580-583
2012-11-16（万方平台首次上网日期，不代表论文的发表时间）