A preparation method of diamond specimens using an advanced FIB microscopy for micro and nanoanalysis
This paper reports the specimen preparation using an advanced dual beam focused ion beam (FIB) technique for bulk polycrystalline diamond (PCD) composites after dynamic friction polishing (DFP).The technique adapted allows for precisely processing diamond materials at the specific polishing track sites of PCD surface,from which large cross-sectional specimens for SEM/EDS/Raman microanalysis could be successfully created.In addition,an in-situ lift-out method was developed to prepare the site-specific HRTEM specimens which were thin enough for imaging the atomic lattice of diamond and for conducting EELS analysis.
Polycrystalline diamond Microstructure Nanostructure Focused Ion Beam
Yiqing CHEN Fengzai TANG LC ZHANG
School of Mechanical and Manufacturing Engineering, The University of New South Wales, NSW 2052, Australia
国际会议
广州
英文
592-595
2012-11-16（万方平台首次上网日期，不代表论文的发表时间）