Design and Test of TLP Excitation Probes

摘要：

　　TLP (transmission line pulser) can produce a short rectangular pulse with a steep rising edge and constant amplitude to simulate the ESDs influence.That can be used to impose interference on a part of PCB and analyze anti-ESD performance of circuit.In order to analyze the PCB board level ESD immunity problems,through analyzing the mechanisms between probes and EUT(equipment under test),E field coupling probe,H field coupling probe and injection probe were designed.A series of tests were carried out in the local region of PCB using the probes as referred to get the coupling waveform.By analyzing the experiment result,the influence created by the TLP on PCB was studied.

关键词： ESD TLP Probe Coupling E field H field

作者: Mingyuan Yang Zhenguang Liang

作者单位: School of Electrical Engineering Shandong University Jinan,China

会议类型: 国际会议

会议名称: Asia-Pacific Conference on Environmental Electromagnetics (2012年第六届亚太环境电磁学会议(CEEM 2012))

会议地点: 上海

会议语种:英文

页码: 100-103

在线出版日期: 2012-11-06（万方平台首次上网日期，不代表论文的发表时间）