LDO EMC Susceptibility Modeling with On-chip Sensor Measurements

摘要：

　　Low-dropout voltage regulator (LDO) is widely used in up-to-date electrical systems but with severe EMC problems.Its susceptibility prediction has become one of the major concerns both of IC suppliers before fabrication to avoid redesign cost and customers before real application to reduce incompatible.This paper presents a LDO susceptibility modeling study including IEC standard modeling flow and immunity test applied to a dedicated test chip.Two on-chip voltage sensors are used to characterize the radio frequency interference propagation inside LDO and thus validate the susceptibility modeling process.

关键词： LDO EMC Susceptibility prediction Immunity test On-chip voltage sensor

作者: Wu Jian-fei Li Jian-cheng Alexandre Boyer Wang Hong-yi Gu Xiao-chen Shen Rong-jun

会议类型: 国际会议

会议名称: Asia-Pacific Conference on Environmental Electromagnetics (2012年第六届亚太环境电磁学会议(CEEM 2012))

会议地点: 上海

会议语种:英文

页码: 270-273

在线出版日期: 2012-11-06（万方平台首次上网日期，不代表论文的发表时间）