Dielectric and pyroelectric properties of highly (100)-oriented (Pb1-x-yLaxCay)Ti1-x/4O3 thin films prepared at low temperature by a sol-gel route
Highly(100) oriented (Pb1-x-yLaxCay)Ti1-x/4O3 (x=0.15,y=0.05,x=0.1,y=0.1,x=0.05,y=0.15)thin films on Pt/Ti/SiO2/Si substrate were successfully achieved using a sol-gel route,it was found that the (Pb1-x-yLaxCay)Ti1-x/4O3 film could be crystallized only at 450 ℃,and the influence of La and Ca contents on dielectric and pyroelectric properties of films was investigated,the dielectric constant of (Pb1-x-yLaxCay)Ti1-x/4O3 film became smaller with the decreasing of La content,and the (Pb1-x-yLaxCay)Ti1-x/4O3 (x=0.1,y=0.1) film possessed higher pyroelectric coefficient (190μC/m2K annealed at 450 ℃,359μC/m2K annealed at 600 ℃) and better pyroelectric figure of merit (76μC/m2K annealed at 450 ℃,211 μC/m2K annealed at 600 ℃)at room temperature.This indicates that the highly oriented (Pb1-x-yLaxCay)Ti1-x/4O3(x=0.1,y=0.1) film annealed at low temperature (450oC) is a good candidate for uncooled IR detector or IR imaging application.
Thin films dielectric properties pyroelectric properties orientation
Chen Chuntian Zhu Hanfei Chi Qingguo
School of Applied Science, Harbin University of Science and Technology, Harbin 150080, China School of Applied Science, Harbin University of Science and Technology, Harbin 150080, China; Key La
国际会议
上海
英文
141-141
2012-10-19（万方平台首次上网日期，不代表论文的发表时间）