Research on the Multi-objective Optimization Model of System-level BIT Testability Index Determination
By weighing reliability,maintainability,availability and life-cycle cost of equipment which are influenced by testability,the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost.The influence mathematical models of system reliability,maintainability,availability and life-circle cost are established.According to these mathematical models,the multi-objective optimization model of system-level BIT testability indexes is established.The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm Ⅱ,and the validity of the multi-objective optimization model is proved through an example.
Multi-object Optimization Model Built-in Test Testability Index Design for Testability Non-dominated Sorting GeneticAlgorithm Ⅱ
Chunsheng Zhu Qi Zhang Fantun Su Hongliang Ran
Engineering Institute of corps of Engineers, PLA University of Sci.& Tech., Nanjing, Jiangsu,210007, China
国际会议
台湾
英文
2223-2227
2011-12-11（万方平台首次上网日期，不代表论文的发表时间）