Image-Based Inspection System for Detection of Glass Substrates Edge Defects
Large size TFT-LCD (Thin-Film Transistor Liquid-Crystal Display,which is commonly called as panel) is made after lots of processes and is cut based on the required size in the last process.Deckle-edge (Burr) and other defects were produced by cutting.Therefore,it needs to examine the products defects before grinding the edges or the following processes.This research developed a new type and high-efficiency apparatus for panel-edge inspection.The defects are sorted based on three types Fractures,Cracks and Dark-spots by using image-subtraction,binary thresholding,and blob-analysis methods.The proposed system can improve the efficiency on panel-edge inspection for panel manufacturers.The production of flat panel-edge inspection can be increased to over 40% which can resolve the bottleneck processes for panel industry.
Automatic optic inspection Glass Image processing Defect detection
Quang-Cherng Hsu Chi-Ming Lin
Department of Mechanical Engineering, National Kaohsiung University of Applied Sciences415 Chien-Kung Road, 80778 Kaohsiung City, Taiwan, R.O.C
国际会议
台湾
英文
3970-3976
2011-12-11（万方平台首次上网日期，不代表论文的发表时间）