Effect Of Rack-Aware Placement in Cloud Storage System

摘要：

　　We are witnessing the rapid development of Cloud Computing techniques and services.Cloud Storage is widely applied in nowadays research and industry community.One of the most hottest topic in cloud storage is the data reliability.To ensure reliability under the condition of inexpensive hardware,several techniques are discussed and applied.We simplify and analyze the data reliability by a markov model,which includes the discussion of correlated failures and rack-aware placement.Our model aims to tell the effect of rack-aware placement for cloud storage systems.

关键词： rack-aware MTTDL reliability

作者: Zhen Huang Yuan Yuan Yuxing Peng

作者单位: National Laboratory of Parallel and Distributed Processing, Computer Department,National University of Defense Technology, Changsha, Hunan, China

会议类型: 国际会议

会议名称: the Second International Conference on Frontiers of Manufacturing and Design Science(第二届制造与设计科学国际会议(ICFMD 2011))

会议地点: 台湾

会议语种:英文

页码: 4446-4450

在线出版日期: 2011-12-11（万方平台首次上网日期，不代表论文的发表时间）