Effects of Annealing Temperature on Morphology and Dielectric Property of BiFeO3 Films

摘要：

　　BiFeO3 thin films were prepared by sol-gel method using Fe(NO3)3·9H2O and Bi(NO3)3·5H2O as raw materials.The effects of annealing temperatures on the morphology and dielectric property of the thin films were studied.XRD results show that the multi-crystal thin films with pure phase are obtained when annealed at 500 ℃ and 550 ℃.But annealing at 580 ℃ will lead to the appearance of Bi2.46Fe5O12 phase.AFM images show that as the increase of annealing temperatures the surface toughness of the thin film is decreased,but the surface undulation of the thin films is decreased gradually.Within the frequency range of 1 KHz ~1 MHz,the dielectric constant of BiFeO3 thin films is kept over 125 and it does not change very much from 500 ℃ to 580 ℃.Annealed at 550 ℃,the BiFeO3 thin films with the lower loss are obtained.At 1 MHz,the dielectric loss is 0.12.

关键词： Multi-ferroic Material BiFeO3 Thin Film Dielectric Property Sol-Gel Method

作者: Lili Zhang Guoqiang Tan Meng Cheng Huijun Ren Ao Xia

作者单位: Key Laboratory of Auxiliary Chemistry & Technology for Chemical Industry,Ministry of Education,Shaanxi University of Science and Technology,Xian,Shaanxi,710021,China

会议类型: 国际会议

会议名称: The Seventh China International Conference on High-Performance Ceramics (第七届先进陶瓷国际研讨会(CICC-7))

会议地点: 厦门

会议语种:英文

页码: 1736-1739

在线出版日期: 2011-11-04（万方平台首次上网日期，不代表论文的发表时间）