Detection of Amorphous Silica in Air-Oxidized Ti3SiC2 at 500-1000℃ by NMR and SIMS

摘要：

　　The use of secondary-ion mass spectrometry (SIMS),nuclear magnetic resonance (NMR) and transmission electron microscopy (TEM) to detect the existence of amorphous silica in Ti3SiC2 oxidised at 500-1000℃ is described.The formation of an amorphous SiO2 layer and its growth in thickness with temperature was monitored using dynamic SIMS.Results of NMR and TEM verify for the first time the direct evidence of amorphous silica formation during the oxidation of Ti3SiC2 at ≤ 1000℃.

关键词： Oxidation amorphous phase Ti3SiC2 SIMS NMR

作者: W.K.Pang I.M.Low J.V.Hanna

作者单位: Centre for Materials Research, Department of Imaging and Applied Physics, Curtin University of Techn Department of Physics, University of Warwick, Gibbet Hill Rd., Coventry CV4 7AL, UK

会议类型: 国际会议

会议名称: The Sixth China International Conference on High-Performance Ceramics(第六届中国先进陶瓷国际研讨会(CICC-6))

会议地点: 哈尔滨

会议语种:英文

页码: 169-172

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）