Ferroelectric Properties and Microstructures of Pr6O11-Doped Bi4Ti3O12 Thin Films
Pr6O11-doped bismuth titanate (BixPryTi3O12∶ BPT) thin films with random oriention were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique,and the structures and ferroelectric properties of the films were investigated.XRD studies indicated that all of BPT films consisted of single phase of a bismuth-layered structure with well-developed rod-like grains.For samples with y=0.06,0.3,1.2 and 1.5,ferroelectric hysteresis loops were characterized by large leakage current,whereas for samples with y=0.6 and 0.9,ferroelectric hysteresis loops were the saturated and undistorted hysteresis loops.The remanent polarization (Pr) and coercive field (Ec) of the BPT Film with y=0.9 were above 35μC/cm2 and 80KV/cm,respectively.After 3 × 1010 switching cycles,20% degradation of 2Pr is observed in the film with y=0.9.
Ferroelectric Film Bismuth titanate
M.Chen A.H.Cai X.A.Mei K.L.Su C.Q.Huang Z.M.Wan J.Liu
Department of Physics, Hunan Institute of Science and Technology, Yueyang, 414000, China
国际会议
The Sixth China International Conference on High-Performance Ceramics(第六届中国先进陶瓷国际研讨会(CICC-6))
哈尔滨
英文
281-284
2009-08-16（万方平台首次上网日期，不代表论文的发表时间）